Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Paperback)

Scanning Electron Microscopy: Physics of Image Formation and Microanalysis By P. W. Hawkes (Guest Editor), Ludwig Reimer Cover Image

Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Paperback)

By P. W. Hawkes (Guest Editor), Ludwig Reimer

$219.99


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Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Product Details ISBN: 9783642083723
ISBN-10: 3642083722
Publisher: Springer
Publication Date: December 1st, 2010
Pages: 529
Language: English
Series: Springer Series in Optical Sciences